X-ray sensitivity measurements on CVD diamond film detectors

F. Foulon, T. Pochet, E. Gheeraert

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    Microwave chemical vapor deposited (CVD) diamond films have been used to fabricate radiation detectors. The polycristalline diamond films have a resistivity of 1012 Ω.cm and carrier mobility and lifetime of about 280 cm2/V.s and 530 ps. The detector response to laser pulses (λ = 355, 532 and 1064 nm), X-ray flux (15 - 50 keV) and alpha particles (241Am, 5.49 MeV) has been investigated. The response speed of the detector is in the 100 ps range. A sensitivity of about 3 × 10-10 A/V.Gy.s was measured under 50 keV X-ray flux. The detector current response to X-ray flux is almost linear. It is also shown that CVD diamond detectors can be used for alpha particle counting.

    Original languageBritish English
    Title of host publicationIEEE Nuclear Science Symposium & Medical Imaging Conference
    Pages569-573
    Number of pages5
    Editionpt 1
    StatePublished - 1994
    EventProceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference - San Francisco, CA, USA
    Duration: 30 Oct 19936 Nov 1993

    Publication series

    NameIEEE Nuclear Science Symposium & Medical Imaging Conference
    Numberpt 1

    Conference

    ConferenceProceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference
    CitySan Francisco, CA, USA
    Period30/10/936/11/93

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