X-ray- and electron-induced infrared emission spectroscopy

R. A. Rosenberg; M. Abu Haija; S. P. Watkins

doi:10.1063/1.3115205

X-ray- and electron-induced infrared emission spectroscopy

R. A. Rosenberg, M. Abu Haija, S. P. Watkins

Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

We demonstrate the use of Fourier transform infrared (IR) spectroscopy for midinfrared emission measurements following x-ray or electron excitation. Spectra from an InAs low band-gap semiconductor film, which emits in the IR from 3000 to 3400 cm-1, are presented. There is good agreement between the present results and previously published laser-excited spectra. Using focused beams, it should be possible to perform sub-diffraction-limited IR imaging. In addition, simultaneous structural and electronic analysis could be performed using the x-ray or electron excitation probes.

Original language	British English
Article number	046104
Journal	Review of Scientific Instruments
Volume	80
Issue number	4
DOIs	https://doi.org/10.1063/1.3115205
State	Published - 2009

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10.1063/1.3115205

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title = "X-ray- and electron-induced infrared emission spectroscopy",

abstract = "We demonstrate the use of Fourier transform infrared (IR) spectroscopy for midinfrared emission measurements following x-ray or electron excitation. Spectra from an InAs low band-gap semiconductor film, which emits in the IR from 3000 to 3400 cm-1, are presented. There is good agreement between the present results and previously published laser-excited spectra. Using focused beams, it should be possible to perform sub-diffraction-limited IR imaging. In addition, simultaneous structural and electronic analysis could be performed using the x-ray or electron excitation probes.",

author = "Rosenberg, {R. A.} and {Abu Haija}, M. and Watkins, {S. P.}",

note = "Funding Information: This work was performed at the APS and was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Contract No. DE-AC02-06CH11357.",

year = "2009",

doi = "10.1063/1.3115205",

language = "British English",

volume = "80",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

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T1 - X-ray- and electron-induced infrared emission spectroscopy

AU - Rosenberg, R. A.

AU - Abu Haija, M.

AU - Watkins, S. P.

N1 - Funding Information: This work was performed at the APS and was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Contract No. DE-AC02-06CH11357.

PY - 2009

Y1 - 2009

N2 - We demonstrate the use of Fourier transform infrared (IR) spectroscopy for midinfrared emission measurements following x-ray or electron excitation. Spectra from an InAs low band-gap semiconductor film, which emits in the IR from 3000 to 3400 cm-1, are presented. There is good agreement between the present results and previously published laser-excited spectra. Using focused beams, it should be possible to perform sub-diffraction-limited IR imaging. In addition, simultaneous structural and electronic analysis could be performed using the x-ray or electron excitation probes.

AB - We demonstrate the use of Fourier transform infrared (IR) spectroscopy for midinfrared emission measurements following x-ray or electron excitation. Spectra from an InAs low band-gap semiconductor film, which emits in the IR from 3000 to 3400 cm-1, are presented. There is good agreement between the present results and previously published laser-excited spectra. Using focused beams, it should be possible to perform sub-diffraction-limited IR imaging. In addition, simultaneous structural and electronic analysis could be performed using the x-ray or electron excitation probes.

UR - http://www.scopus.com/inward/record.url?scp=65449116073&partnerID=8YFLogxK

U2 - 10.1063/1.3115205

DO - 10.1063/1.3115205

M3 - Article

AN - SCOPUS:65449116073

SN - 0034-6748

VL - 80

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 4

M1 - 046104

ER -

X-ray- and electron-induced infrared emission spectroscopy

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