Winding turn-to-turn short-circuit diagnosis using FRA method: Sensitivity of measurement configuration

Anurag A. Devadiga, Noureddine Harid, Huw Griffiths, Naji Al Sayari, Braham Barkat, Sheshakamal Jayaram, Hisatoshi Ikeda, Tadashi Koshizuka, Yasuhiko Taniguchi

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