Abstract
Well-aligned, low-resistive zinc oxide (ZnO) nanorods were grown on ZnO-coated glass and p-Si substrates using a simple and economic solution method. The device performance of ZnO nanorods has been investigated by studying their p-n junction diode behaviour at room temperature. The as-grown n-ZnO/p-Si diode exhibited a low turn-on voltage and saturation current of ∼2.25 V and ∼1.27 μA, respectively, with a diode quality factor of 1.9. These investigations reveal that the well-aligned ZnO nanorod structures can be used as an active layer in the fabrication of efficient optoelectronic nano-devices.
Original language | British English |
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Article number | 38001 |
Journal | Europhysics Letters |
Volume | 81 |
Issue number | 3 |
DOIs | |
State | Published - 1 Feb 2008 |