Welcome to SEMI-THERM 31

Research output: Contribution to journal › Editorial

Original language	British English
Article number	7100118
Pages (from-to)	iii-iv
Journal	Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Volume	2015-April
DOIs	https://doi.org/10.1109/SEMI-THERM.2015.7100118
State	Published - 30 Apr 2015
Event	31st Annual Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2015 - San Jose, United States Duration: 15 Mar 2015 → 19 Mar 2015

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@article{c1bd279962874ed994a26ff721b8d17e,

title = "Welcome to SEMI-THERM 31",

author = "Peter Rodgers",

year = "2015",

month = apr,

day = "30",

doi = "10.1109/SEMI-THERM.2015.7100118",

language = "British English",

volume = "2015-April",

pages = "iii--iv",

journal = "Annual IEEE Semiconductor Thermal Measurement and Management Symposium",

issn = "1065-2221",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "31st Annual Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2015 ; Conference date: 15-03-2015 Through 19-03-2015",

}

TY - JOUR

T1 - Welcome to SEMI-THERM 31

AU - Rodgers, Peter

PY - 2015/4/30

Y1 - 2015/4/30

UR - https://www.scopus.com/pages/publications/84945207692

U2 - 10.1109/SEMI-THERM.2015.7100118

DO - 10.1109/SEMI-THERM.2015.7100118

M3 - Editorial

AN - SCOPUS:84945207692

SN - 1065-2221

VL - 2015-April

SP - iii-iv

JO - Annual IEEE Semiconductor Thermal Measurement and Management Symposium

JF - Annual IEEE Semiconductor Thermal Measurement and Management Symposium

M1 - 7100118

T2 - 31st Annual Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2015

Y2 - 15 March 2015 through 19 March 2015

ER -