Original language | British English |
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Article number | 7100118 |
Pages (from-to) | iii-iv |
Journal | Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
Volume | 2015-April |
DOIs | |
State | Published - 30 Apr 2015 |
Event | 31st Annual Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2015 - San Jose, United States Duration: 15 Mar 2015 → 19 Mar 2015 |