Variation-aware modelling of micro-scale piezoelectric energy harvesters

Wajih U. Syed, Alabi Bojesomo, Ibrahim M. Elfadel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

The inherent tolerances in MEMS fabrication processes introduce variability that causes the device performance to deviate systematically from its designed values. In this work, we have used Monte-Carlo (MC) simulation to propagate process variability through a piezoelectric energy harvester (PEH) finite element model (FEM) and its extracted equivalent circuit model (ECM) to discover the uncertainty models of its performance metrics, such as optimal power and resonance frequency and its ECM parameters. Characterization results of a set of fabricated PEH devices were compared against the MC-derived uncertainty models to explain the statistical spread.

Original languageBritish English
Title of host publicationSymposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2018
EditorsRomolo Marcelli, Yoshio Mita, Stewart Smith, Francis Pressecq, Pascal Nouet, Frederick Mailly, Peter Schneider
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781538661994
DOIs
StatePublished - 22 Jun 2018
Event20th Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2018 - Roma, Italy
Duration: 22 May 201825 May 2018

Publication series

NameSymposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2018

Conference

Conference20th Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2018
Country/TerritoryItaly
CityRoma
Period22/05/1825/05/18

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