Variability analysis of a 28nm near-threshold synchronous voltage converter

Temesghen Tekeste, Ayman Shabra, Duane Boning, Ibramim Elfadel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

An important synchronous circuit element in low-power digital circuit design is the voltage level shifter at the boundary between voltage domains. In this paper, we present a full variability analysis of an optimized, synchronous pulsed half-latch level converter (PHLC) in the GLOBALFOUNDRIES 28nm technology. The variability analysis clearly illustrates the impact of ultra-low-power design on delay, energy and the energy-delay product (EDP). In particular, the normalized standard deviation for EDP in near-threshold operation is more than twice its value for nominal-supply operation. The analysis also illustrates the impact of variability on the architectural and topological decisions a designer has to make in ultra-low power design.

Original languageBritish English
Title of host publication2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages723-726
Number of pages4
ISBN (Print)9781479924523
DOIs
StatePublished - 2013
Event2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013 - Abu Dhabi, United Arab Emirates
Duration: 8 Dec 201311 Dec 2013

Publication series

NameProceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Conference

Conference2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
Country/TerritoryUnited Arab Emirates
CityAbu Dhabi
Period8/12/1311/12/13

Keywords

  • near-threshold design
  • ultra-low-power design
  • variability analysis
  • voltage converters

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