@inproceedings{da542846fb8b4da48ce70b9c83367626,
title = "Using Conductive Atomic Force Microscopy to the Evaluate Electrical Properties of MoS2nanoparticles for Device Applications",
abstract = "Conductive Atomic Force microscopy (CAFM) is used to investigate the structural and electrical characteristics of Molybdenum disulfide nanomaterials. MoS2 is exfoliated using chemical and mechanical processes. AFM images are produced to show the structure, thickness, and distribution in tapping mode. Furthermore, CAFM is used to generate the IV response of the coated films on Si. The IV curves show a nonlinear diode like behavior making MoS2 nanoparticles an attractive material for future nanoscale electronic devices.",
author = "Aisha Alhammadi and Wafa Alnaqbi and Juveiriah Ashraf and Ayman Rezk and Ammar Nayfeh",
note = "Funding Information: This publication is based upon work supported by the Khalifa University of Science and Technology Publisher Copyright: {\textcopyright} 2021 ECS-The Electrochemical Society.; 240th ECS Meeting ; Conference date: 10-10-2021 Through 14-10-2021",
year = "2021",
doi = "10.1149/10403.0017ecst",
language = "British English",
series = "ECS Transactions",
publisher = "IOP Publishing Ltd.",
number = "3",
pages = "17--19",
booktitle = "240th ECS Meeting - Semiconductors, Dielectrics, and Metals for Nanoelectronics 18",
address = "United Kingdom",
edition = "3",
}