Understanding common-mode noise on wide data-buses

Alina Deutsch, Howard H. Smith, Gerard V. Kopcsay, Byron L. Krauter, Christopher W. Surovic, Abe Elfadel, David J. Widiger

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

9 Scopus citations


This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(nL(nC behavior ofthe reference series impedance.

Original languageBritish English
Title of host publicationElectrical Performance of Electronic Packaging
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages4
ISBN (Electronic)0780381289, 9780780381285
StatePublished - 2003
EventElectrical Performance of Electronic Packaging, 2003 - Princeton, United States
Duration: 27 Oct 200329 Oct 2003

Publication series

NameElectrical Performance of Electronic Packaging


ConferenceElectrical Performance of Electronic Packaging, 2003
Country/TerritoryUnited States


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