@inproceedings{218c01ab4e944d9a8db1b97044571896,
title = "Understanding common-mode noise on wide data-buses",
abstract = "This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(nL(nC behavior ofthe reference series impedance.",
author = "Alina Deutsch and Smith, {Howard H.} and Kopcsay, {Gerard V.} and Krauter, {Byron L.} and Surovic, {Christopher W.} and Abe Elfadel and Widiger, {David J.}",
note = "Publisher Copyright: {\textcopyright} 2003 IEEE.; Electrical Performance of Electronic Packaging, 2003 ; Conference date: 27-10-2003 Through 29-10-2003",
year = "2003",
doi = "10.1109/EPEP.2003.1250056",
language = "British English",
series = "Electrical Performance of Electronic Packaging",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "309--312",
booktitle = "Electrical Performance of Electronic Packaging",
address = "United States",
}