Time dependence of electrical characteristics during the charge decay from a single gold nanoparticle on silicon

Yawar Abbas, Ayman Rezk, Irfan Saadat, Ammar Nayfeh, Moh'd Rezeq

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

In this work, we investigate the time dependence of trapped charge in isolated gold nanoparticles (Au-NPS) dispersed on n-Si substrates, based on the electrical characteristics of nano metal-semiconductor junctions. The current-voltage (I-V) characteristics have been analysed on a single Au-NP at different time intervals, using conductive mode atomic force microscopy (AFM). The Au-NPs have been characterized for their morphology and optical properties using transmission electron microscopy (TEM), ultraviolet visible (UV-vis) spectroscopy and scanning electron microscopy (SEM). The tunneling current is found to be a direct function of the trapped charge in the NP, due to the charge screening effect of the electric field at the NP/n-Si interface. The evolution of the I-V curves is observed at different time intervals until all the trapped charge dissipates. Moreover, the time needed for nanoparticles to restore their initial state is verified and the dependence of the trapped charge on the applied voltage sweep is investigated.

Original languageBritish English
Pages (from-to)41741-41746
Number of pages6
JournalRSC Advances
Volume10
Issue number68
DOIs
StatePublished - 16 Nov 2020

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