Abstract
The effect of Impact Ionization (II) on thin film c-Si solar cells is modeled and investigated by TCAD simulation. The doping concentration of absorber layer is varied to see the effect of Impact Ionization (II) on c-Si solar cell by increasing the electric field. The results show that, II can increase the short circuit current (Jsc). Namely we show a 2mA/cm2 increase in Jsc by increasing the doping of the c-Si layer from 1×1018 cm-3 to 1×10 19 cm-3. In addition the Internal Quantum Efficiency (IQE) increases from 98% to 116% with impact ionization.
Original language | British English |
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Pages | 681-684 |
Number of pages | 4 |
DOIs | |
State | Published - 2013 |
Event | UKSim-AMSS 7th European Modelling Symposium on Computer Modelling and Simulation, EMS 2013 - Manchester, United Kingdom Duration: 20 Nov 2013 → 22 Nov 2013 |
Conference
Conference | UKSim-AMSS 7th European Modelling Symposium on Computer Modelling and Simulation, EMS 2013 |
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Country/Territory | United Kingdom |
City | Manchester |
Period | 20/11/13 → 22/11/13 |
Keywords
- Impact Ionization
- Internal Quantum Efficiency
- Short circuit current density
- solar cells
- thin film