Thin film a-Si/c-Si1-xGex/c-Si heterojunction solar cells with Ge content up to 56%

Sabina Abdul Hadi, Pouya Hashemi, Nicole Dilello, Ammar Nayfeh, Judy L. Hoyt

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

20 Scopus citations

Abstract

Thin film a-Si(n+)/c-Si1-xGex(p)/c- Si(p+) heterojunction solar cells are fabricated with Ge content up to 56 atomic percent. Solar cells with junction layers consisting of Si, Si 0.75Ge0.25, Si0.59Ge0.41, and Si0.44Ge0.56 are compared to study the effect of increasing Ge concentration. The measured short-circuit current (Jsc) increases from 14 mA/cm2 for Si cells to 21 mA/cm2 for the Si0.44Ge0.56 cells, for one light pass and a 2 μm-thick SiGe layer. The results show an open-circuit voltage (V oc) of 0.61 V for Si cells, dropping to 0.32 V for Si 0.44Ge0.56, consistent with the reduction in band-gap. Quantum efficiency measurements highlight the improved spectral response for higher Ge percentages. Physics based TCAD simulations combined with the experimental results are used to extract lifetime and interface velocity.

Original languageBritish English
Title of host publicationProgram - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Pages5-8
Number of pages4
DOIs
StatePublished - 2012
Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
Duration: 3 Jun 20128 Jun 2012

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Country/TerritoryUnited States
CityAustin, TX
Period3/06/128/06/12

Keywords

  • carrier lifetime
  • HIT solar cells
  • photovoltaic cells
  • SiGe thin film
  • silicon

Fingerprint

Dive into the research topics of 'Thin film a-Si/c-Si1-xGex/c-Si heterojunction solar cells with Ge content up to 56%'. Together they form a unique fingerprint.

Cite this