The nano-scratch technique as a novel method for measurement of an interphase width

A. Hodzic; J. K. Kim; Z. H. Stachurski

doi:10.1023/A:1006726429262

The nano-scratch technique as a novel method for measurement of an interphase width

A. Hodzic, J. K. Kim, Z. H. Stachurski

Mechanical & Nuclear Engineering

Australian National University

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

Nano-scratch technique for identifying and measuring the interphase region in multiphase materials was described. Nano-scratch test involved moving a sample while being in contact with the diamond indenter tip. Two values of normal forces, 0.4 mN and 1 mN, were studied to determine the influence of the tip to the scratch morphology.

Original language	British English
Pages (from-to)	1665-1667
Number of pages	3
Journal	Journal of Materials Science Letters
Volume	19
Issue number	18
DOIs	https://doi.org/10.1023/A:1006726429262
State	Published - 2000

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title = "The nano-scratch technique as a novel method for measurement of an interphase width",

abstract = "Nano-scratch technique for identifying and measuring the interphase region in multiphase materials was described. Nano-scratch test involved moving a sample while being in contact with the diamond indenter tip. Two values of normal forces, 0.4 mN and 1 mN, were studied to determine the influence of the tip to the scratch morphology.",

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AB - Nano-scratch technique for identifying and measuring the interphase region in multiphase materials was described. Nano-scratch test involved moving a sample while being in contact with the diamond indenter tip. Two values of normal forces, 0.4 mN and 1 mN, were studied to determine the influence of the tip to the scratch morphology.

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The nano-scratch technique as a novel method for measurement of an interphase width

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