The Impact of Topology and Mission Profile on the Reliability of Boost-type Converters in PV Applications

Saeed Peyghami, Pooya Davari, Huai Wang, Frede Blaabjerg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    28 Scopus citations

    Abstract

    This paper investigates the impact of different converter topologies and mission profiles on the reliability of dc/dc boost-type PV converters. The reliability of three boost-type converters with the same input/output specifications is modeled employing a mission profile-based reliability evaluation method considering non-constant failure rate for the electrical components. This study identifies the contribution of active and passive components on the converter reliability for identifying the most failure prone components. Furthermore, the applicability of converter structures for different climate conditions is demonstrated seen from the reliability point of view.

    Original languageBritish English
    Title of host publication2018 IEEE 19th Workshop on Control and Modeling for Power Electronics, COMPEL 2018
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Print)9781538655412
    DOIs
    StatePublished - 10 Sep 2018
    Event19th IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2018 - Padova, Italy
    Duration: 25 Jun 201828 Jun 2018

    Publication series

    Name2018 IEEE 19th Workshop on Control and Modeling for Power Electronics, COMPEL 2018

    Conference

    Conference19th IEEE Workshop on Control and Modeling for Power Electronics, COMPEL 2018
    Country/TerritoryItaly
    CityPadova
    Period25/06/1828/06/18

    Keywords

    • boost converter
    • interleaved boost converter
    • mission profile
    • PV converter
    • reliability

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