The effect of power islands on delta-I noise, interconnect noise, and timing for wide, on-chip data-buses

A. Deutsch, H. H. Smith, H. M. Huang, A. Elfadel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A study is shown of the effect of having breaks in the power distribution on large microprocessor chips. The effect on delta-I noise, interconnect noise, and timing is illustrated through simulation results obtained with representative driver and receiver circuits and guidelines are given on how to minimize the impact of the power islands.

Original languageBritish English
Title of host publication14th Topical Meeting on Electrical Performance of Electronic Packaging 2005
Pages303-306
Number of pages4
DOIs
StatePublished - 2005
Event14th Topical Meeting on Electrical Performance of Electronic Packaging 2005 - Austin, TX, United States
Duration: 24 Oct 200526 Oct 2005

Publication series

NameIEEE Topical Meeting on Electrical Performance of Electronic Packaging
Volume2005

Conference

Conference14th Topical Meeting on Electrical Performance of Electronic Packaging 2005
Country/TerritoryUnited States
CityAustin, TX
Period24/10/0526/10/05

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