TY - GEN
T1 - System-level reliability assessment of power stage in fuel cell application
AU - Zhou, Dao
AU - Wang, Huai
AU - Blaabjerg, Frede
AU - Kor, Soren Kundsen
AU - Blom-Hansen, Daniel
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016
Y1 - 2016
N2 - High efficient and less pollutant fuel cell stacks are emerging and strong candidates of the power solution used for mobile base stations. In the application of the backup power, the availability and reliability hold the highest priority. This paper considers the reliability metrics from the component-level to the system-level for the power stage used in a fuel cell application. It starts with an estimation of the annual accumulated damage for the key power electronic components according to the real mission profile of the fuel cell system. Then, considering the parameter variations in both the lifetime model and the stress levels, the Weibull distribution of the power semiconductors lifetime can be obtained by using Monte Carlo analysis. Afterwards, the reliability block diagram can further be adopted to evaluate the reliability of the power stage based on the estimated power semiconductor reliability. In a case study of a 5 kW fuel cell power stage, the parameter variations of the lifetime model prove that the exponential factor of the junction temperature fluctuation is the most sensitive parameter. Besides, if a 5-out-of-6 redundancy is used, it is concluded both the B10 and the B¡ system-level lifetime can be remarkably increased compared to when no redundancy is used.
AB - High efficient and less pollutant fuel cell stacks are emerging and strong candidates of the power solution used for mobile base stations. In the application of the backup power, the availability and reliability hold the highest priority. This paper considers the reliability metrics from the component-level to the system-level for the power stage used in a fuel cell application. It starts with an estimation of the annual accumulated damage for the key power electronic components according to the real mission profile of the fuel cell system. Then, considering the parameter variations in both the lifetime model and the stress levels, the Weibull distribution of the power semiconductors lifetime can be obtained by using Monte Carlo analysis. Afterwards, the reliability block diagram can further be adopted to evaluate the reliability of the power stage based on the estimated power semiconductor reliability. In a case study of a 5 kW fuel cell power stage, the parameter variations of the lifetime model prove that the exponential factor of the junction temperature fluctuation is the most sensitive parameter. Besides, if a 5-out-of-6 redundancy is used, it is concluded both the B10 and the B¡ system-level lifetime can be remarkably increased compared to when no redundancy is used.
UR - http://www.scopus.com/inward/record.url?scp=85015424281&partnerID=8YFLogxK
U2 - 10.1109/ECCE.2016.7855492
DO - 10.1109/ECCE.2016.7855492
M3 - Conference contribution
AN - SCOPUS:85015424281
T3 - ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings
BT - ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016
Y2 - 18 September 2016 through 22 September 2016
ER -