Abstract
Non-invasive inspection, material evaluation and characterization are of paramount importance for quality control and structural health monitoring in various applications. Microwave imaging modalities have proven significant potential in such applications. Herein, a substrate integrated waveguide cavity-backed slot antenna is designed to operate in the X-band frequency range. The proposed antenna is modeled and analyzed using an electromagnetic simulation software, and its near-field characteristics are verified experimentally. The utility of the proposed antenna for imaging applications is demonstrated by imaging low-loss and high-loss material samples.
Original language | British English |
---|---|
Title of host publication | I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference |
Subtitle of host publication | Discovering New Horizons in Instrumentation and Measurement, Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1-5 |
Number of pages | 5 |
ISBN (Electronic) | 9781538622223 |
DOIs | |
State | Published - 10 Jul 2018 |
Event | 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 - Houston, United States Duration: 14 May 2018 → 17 May 2018 |
Publication series
Name | I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings |
---|
Conference
Conference | 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 |
---|---|
Country/Territory | United States |
City | Houston |
Period | 14/05/18 → 17/05/18 |
Keywords
- cavity-backed slot antenna
- microwave imaging
- near-field