SiC MOSFET短路失效与退化机理研究综述及展望

Translated title of the contribution: Review and Prospect of Short-circuit Failure and Degradation Mechanism of SiC MOSFET

Jianlong Kang, Zhen Xin, Jianliang Chen, Huai Wang, Wuhua Li

    Research output: Contribution to journalReview articlepeer-review

    8 Scopus citations

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