Self-healing analog/RF circuits

Shupeng Sun, Fa Wang, Soner Yaldiz, Xin Li, Lawrence Pileggi, Arun Natarajan, Mark Ferriss, Jean Olivier Plouchart, Bodhisatwa Sadhu, Ben Parker, Alberto Valdes-Garcia, Mihai A.T. Sanduleanu, Jose Tierno, Daniel Friedman

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review


Process variation is the most critical issue for the nanoscale analog and radiofrequency integrated circuits (ICs). There are many traditional techniques to mitigate the process variations problems which are mainly based on some form of static approach. However, as the traditional over-design technique becomes impractical, on-chip self-healingwhich is a dynamic approach has emerged as a promising methodology to address the variability issue. The key idea of self-healing is to actively monitor the post-manufacturing circuit performance metrics and then adaptively adjust a number of tuning knobs, such as bias voltage, in order to meet the given performance specifications. This chapter discusses the self-healing mechanism based analog and radio-frequency ICs.

Original languageBritish English
Title of host publicationNano-CMOS and Post-CMOS Electronics
Subtitle of host publicationCircuits and Design
PublisherInstitution of Engineering and Technology
Number of pages34
ISBN (Electronic)9781785610004
ISBN (Print)9781849199995
StatePublished - 1 Jan 2016


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