Abstract
Photoluminescence is observed at room temperature from phonon-assisted band-to-band emission in Si (1.067 eV peak) using unpatterned bulk p-type silicon wafer samples that were spin-coated with Er-doped (6 at.%) silica-gel films (0.13 μm) and vacuum annealed; the strongest emission was obtained at ∼700 °C. Comparative study of annealing behavior indicates an efficiency enhancement of two orders of magnitude. Emission from Er3+ ions in the silica film is used to gauge relative emission strengths. Mechanisms for inducing emission from silicon utilizing stresses in sol-gel films are discussed.
| Original language | British English |
|---|---|
| Pages (from-to) | 767-770 |
| Number of pages | 4 |
| Journal | Scripta Materialia |
| Volume | 65 |
| Issue number | 9 |
| DOIs | |
| State | Published - Nov 2011 |
Keywords
- Photoluminescence
- Semiconductor silicon
- Sol-gel materials
- Thin films