Reproducibility and field emission characteristics of nanotips fabricated by local electron bombardment

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The rapid advance in microscopy in the last few decades enabled researchers to fabricate, manipulate and characterize materials at nano-scale. The fabrication of ultrasharp tips with an apex of few nanometers (referred to as nanotips) and single atom tips (SATs) considerably optimizes the image resolution of scanning probe microscopes and electron microscopes to reach the level of atomic resolution. Several techniques were introduced in order to optimize the fabrication process of nanotips. Here, we experimentally verify the reproducibility of nanotip fabrication using the recent local electron bombardment method. Also, we investigate the field emission characteristics of such nanotips using the field emission microscope.

Original languageBritish English
Title of host publication2016 IEEE 59th International Midwest Symposium on Circuits and Systems, MWSCAS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509009169
DOIs
StatePublished - 2 Jul 2016
Event59th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2016 - Abu Dhabi, United Arab Emirates
Duration: 16 Oct 201619 Oct 2016

Publication series

NameMidwest Symposium on Circuits and Systems
Volume0
ISSN (Print)1548-3746

Conference

Conference59th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2016
Country/TerritoryUnited Arab Emirates
CityAbu Dhabi
Period16/10/1619/10/16

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