Reliability Study of Input Side Capacitors in Impedance-Source PV Microconverters

Elizaveta Liivik, Dmitri Vinnikov, Andrii Chub, Yanfeng Shen, Huai Wang, Frede Blaabjerg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations

    Abstract

    This paper discusses reliability issues of three different types of capacitors (ceramic, electrolytic and film) applied in the input side of an impedance-source photovoltaic (PV) microconverter having an ultra-wide dc gain range. The study considers a wear-out failure analysis based on a daily PV mission profile. The general operation and control principle are first described. Then the selection criteria of the capacitors are analyzed. Experimental measurements of capacitors temperature are translated into accumulated damage using their corresponding lifetime models. Finally, conclusions are drawn regarding the applicability of different capacitor technologies in impedance-source PV microconverters, where the film capacitor has the lowest damage.

    Original languageBritish English
    Title of host publicationProceedings
    Subtitle of host publicationIECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
    PublisherIEEE Computer Society
    Pages5026-5032
    Number of pages7
    ISBN (Electronic)9781728148786
    DOIs
    StatePublished - Oct 2019
    Event45th Annual Conference of the IEEE Industrial Electronics Society, IECON 2019 - Lisbon, Portugal
    Duration: 14 Oct 201917 Oct 2019

    Publication series

    NameIECON Proceedings (Industrial Electronics Conference)
    Volume2019-October

    Conference

    Conference45th Annual Conference of the IEEE Industrial Electronics Society, IECON 2019
    Country/TerritoryPortugal
    CityLisbon
    Period14/10/1917/10/19

    Keywords

    • impedance-source
    • PV microinverter
    • reliability

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