Reliability evaluation of an impedance-source PV microconverter

Yanfeng Shen, Elizaveta Liivik, Frede Blaabjerg, Dmitri Vinnikov, Huai Wang, Andrii Chub

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    9 Scopus citations

    Abstract

    The reliability of an impedance-source PV microconverter is evaluated based on the real-field mission profile. As part of a PV microinverter, the dc-dc microconverter is firstly described. Then the electro-thermal and lifetime models are built for the most reliability-critical components, i.e., the power semiconductor devices and capacitors. The finite element method (FEM) simulation is used for the thermal impedance extraction. The mission profile, i.e., the ambient temperature and solar irradiance, from Aalborg, Denmark is applied to the built electrothermal model. Finally, the thermal loading profiles and annual wear-out damage accumulation are obtained. In addition, experimental measurements from a 300-W converter prototype are given.

    Original languageBritish English
    Title of host publicationAPEC 2018 - 33rd Annual IEEE Applied Power Electronics Conference and Exposition
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages1104-1108
    Number of pages5
    ISBN (Electronic)9781538611807
    DOIs
    StatePublished - 18 Apr 2018
    Event33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018 - San Antonio, United States
    Duration: 4 Mar 20188 Mar 2018

    Publication series

    NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
    Volume2018-March

    Conference

    Conference33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018
    Country/TerritoryUnited States
    CitySan Antonio
    Period4/03/188/03/18

    Keywords

    • Microconverter
    • PV
    • Reliability

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