@inproceedings{5f0842ff46ee4c20b65bcc3b2c7bc658,
title = "Reliability evaluation of an impedance-source PV microconverter",
abstract = "The reliability of an impedance-source PV microconverter is evaluated based on the real-field mission profile. As part of a PV microinverter, the dc-dc microconverter is firstly described. Then the electro-thermal and lifetime models are built for the most reliability-critical components, i.e., the power semiconductor devices and capacitors. The finite element method (FEM) simulation is used for the thermal impedance extraction. The mission profile, i.e., the ambient temperature and solar irradiance, from Aalborg, Denmark is applied to the built electrothermal model. Finally, the thermal loading profiles and annual wear-out damage accumulation are obtained. In addition, experimental measurements from a 300-W converter prototype are given.",
keywords = "Microconverter, PV, Reliability",
author = "Yanfeng Shen and Elizaveta Liivik and Frede Blaabjerg and Dmitri Vinnikov and Huai Wang and Andrii Chub",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018 ; Conference date: 04-03-2018 Through 08-03-2018",
year = "2018",
month = apr,
day = "18",
doi = "10.1109/APEC.2018.8341154",
language = "British English",
series = "Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1104--1108",
booktitle = "APEC 2018 - 33rd Annual IEEE Applied Power Electronics Conference and Exposition",
address = "United States",
}