TY - GEN
T1 - Real mission profile based lifetime estimation of fuel-cell power converter
AU - Zhou, Dao
AU - Wang, Huai
AU - Blaabjerg, Frede
AU - Kaer, Soeren Knudsen
AU - Blom-Hansen, Daniel
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/7/13
Y1 - 2016/7/13
N2 - Fuel cells are becoming a promising energy source for various applications due to its relatively high efficiency and reliability, and low pollution. They have been applied in backup power systems in telecom applications, where reliability and availability are high priority performance factors. This paper describes a lifetime prediction method for the power semiconductors used in the power conditioning of a fuel cell based backup system, considering both the long-term standby mode and active operation mode. The annual ambient temperature profile is taken into account to estimate its impact on the degradation of MOSFETs during the standby mode. At the presence of power outages, the backup system is activated into the operation mode and the MOSFETs withstand additional thermal stresses due to power losses. A study case of a 1 kW backup system is presented with two annual mission profiles in Denmark and India, respectively. The ambient temperature, occurrence frequency of power outages, active operation time and power levels are considered for the lifetime prediction of the applied MOSFETs. Comparisons of the accumulated lifetime consumptions are performed between standby mode and operation mode, and between Denmark and India, respectively.
AB - Fuel cells are becoming a promising energy source for various applications due to its relatively high efficiency and reliability, and low pollution. They have been applied in backup power systems in telecom applications, where reliability and availability are high priority performance factors. This paper describes a lifetime prediction method for the power semiconductors used in the power conditioning of a fuel cell based backup system, considering both the long-term standby mode and active operation mode. The annual ambient temperature profile is taken into account to estimate its impact on the degradation of MOSFETs during the standby mode. At the presence of power outages, the backup system is activated into the operation mode and the MOSFETs withstand additional thermal stresses due to power losses. A study case of a 1 kW backup system is presented with two annual mission profiles in Denmark and India, respectively. The ambient temperature, occurrence frequency of power outages, active operation time and power levels are considered for the lifetime prediction of the applied MOSFETs. Comparisons of the accumulated lifetime consumptions are performed between standby mode and operation mode, and between Denmark and India, respectively.
UR - http://www.scopus.com/inward/record.url?scp=84983283827&partnerID=8YFLogxK
U2 - 10.1109/IPEMC.2016.7512741
DO - 10.1109/IPEMC.2016.7512741
M3 - Conference contribution
AN - SCOPUS:84983283827
T3 - 2016 IEEE 8th International Power Electronics and Motion Control Conference, IPEMC-ECCE Asia 2016
SP - 2798
EP - 2805
BT - 2016 IEEE 8th International Power Electronics and Motion Control Conference, IPEMC-ECCE Asia 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th IEEE International Power Electronics and Motion Control Conference, IPEMC-ECCE Asia 2016
Y2 - 22 May 2016 through 26 May 2016
ER -