Rapid discrimination of chemically distinctive surface terminations in 2D material based heterostructures by direct van der Waals identification

Srinivasa Reddy Tamalampudi, Sergio Santos, Chia Yun Lai, Tuza A. Olukan, Jin You Lu, Nitul Rajput, Matteo Chiesa

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We demonstrate that surfaces presenting heterogeneous and atomically flat domains can be directly and rapidly discriminated via robust intensive quantifiables by exploiting one-pass noninvasive methods in standard atomic force microscopy (AFM), single ∼2 min passes, or direct force reconstruction, i.e., ∼103 force profiles (∼10 min collection time), allowing data collection, interpretation, and presentation in under 20 min, including experimental AFM preparation and excluding only sample fabrication, in situ and without extra experimental or time load. We employ a misfit SnTiS3 compound as a model system. Such heterostructures can be exploited as multifunctional surface systems and provide multiple support sites with distinguishable chemical, mechanical, or opto-electronic distinct properties. In short, they provide an ideal model system to exemplify how current AFM methods can significantly support material discovery across fields.

Original languageBritish English
Article number023907
JournalReview of Scientific Instruments
Volume91
Issue number2
DOIs
StatePublished - 1 Feb 2020

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