Quantitative analysis to the electric field generated at a nano-tip and the effect of the tip base

Moh'D Rezeq

doi:10.1109/IEEEGCC.2011.5752518

Quantitative analysis to the electric field generated at a nano-tip and the effect of the tip base

Moh'D Rezeq

Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Nanotips are the main components in most of the powerful nanotechnology tools like scanning tunneling microscope (STM) and scanning transmission electron microscope (TEM). Therefore the improvement of the performance of these microscopes relies on fabricating extremely sharp tips with well defined shapes. Tips with an apex radius of a few nanometers are often characterized in the field ion microscope (FIM) or the field emission microscope (FEM), to estimate their sizes. However, these methods are only sufficient for characterizing the very end of the tip. Here we present a quantitative model that links the electric field, which is adequate to generate either FIM or FEM images at certain applied voltages, to the radius of the nanotip and to the radius of the tip base as well. This model introduces a more accurate method to estimate the overall tip shape over a relatively long range.

Original language	British English
Title of host publication	2011 IEEE GCC Conference and Exhibition, GCC
Pages	25-28
Number of pages	4
DOIs	https://doi.org/10.1109/IEEEGCC.2011.5752518
State	Published - 2011
Event	2011 IEEE GCC Conference and Exhibition, GCC 2011 - Dubai, United Arab Emirates Duration: 19 Feb 2011 → 22 Feb 2011

Publication series

Name	2011 IEEE GCC Conference and Exhibition, GCC 2011

Conference

Conference	2011 IEEE GCC Conference and Exhibition, GCC 2011
Country/Territory	United Arab Emirates
City	Dubai
Period	19/02/11 → 22/02/11

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

field emission
nano electron source
nano fabrication
Nanotip

Access to Document

10.1109/IEEEGCC.2011.5752518

OpenUrl availability

Full text

Cite this

@inproceedings{e4a9f824ca014330bde78c41158c7eab,

title = "Quantitative analysis to the electric field generated at a nano-tip and the effect of the tip base",

abstract = "Nanotips are the main components in most of the powerful nanotechnology tools like scanning tunneling microscope (STM) and scanning transmission electron microscope (TEM). Therefore the improvement of the performance of these microscopes relies on fabricating extremely sharp tips with well defined shapes. Tips with an apex radius of a few nanometers are often characterized in the field ion microscope (FIM) or the field emission microscope (FEM), to estimate their sizes. However, these methods are only sufficient for characterizing the very end of the tip. Here we present a quantitative model that links the electric field, which is adequate to generate either FIM or FEM images at certain applied voltages, to the radius of the nanotip and to the radius of the tip base as well. This model introduces a more accurate method to estimate the overall tip shape over a relatively long range.",

keywords = "field emission, nano electron source, nano fabrication, Nanotip",

author = "Moh'D Rezeq",

year = "2011",

doi = "10.1109/IEEEGCC.2011.5752518",

language = "British English",

isbn = "9781612841199",

series = "2011 IEEE GCC Conference and Exhibition, GCC 2011",

pages = "25--28",

booktitle = "2011 IEEE GCC Conference and Exhibition, GCC",

note = "2011 IEEE GCC Conference and Exhibition, GCC 2011 ; Conference date: 19-02-2011 Through 22-02-2011",

}

Rezeq, MD 2011, Quantitative analysis to the electric field generated at a nano-tip and the effect of the tip base. in 2011 IEEE GCC Conference and Exhibition, GCC., 5752518, 2011 IEEE GCC Conference and Exhibition, GCC 2011, pp. 25-28, 2011 IEEE GCC Conference and Exhibition, GCC 2011, Dubai, United Arab Emirates, 19/02/11. https://doi.org/10.1109/IEEEGCC.2011.5752518

TY - GEN

T1 - Quantitative analysis to the electric field generated at a nano-tip and the effect of the tip base

AU - Rezeq, Moh'D

PY - 2011

Y1 - 2011

N2 - Nanotips are the main components in most of the powerful nanotechnology tools like scanning tunneling microscope (STM) and scanning transmission electron microscope (TEM). Therefore the improvement of the performance of these microscopes relies on fabricating extremely sharp tips with well defined shapes. Tips with an apex radius of a few nanometers are often characterized in the field ion microscope (FIM) or the field emission microscope (FEM), to estimate their sizes. However, these methods are only sufficient for characterizing the very end of the tip. Here we present a quantitative model that links the electric field, which is adequate to generate either FIM or FEM images at certain applied voltages, to the radius of the nanotip and to the radius of the tip base as well. This model introduces a more accurate method to estimate the overall tip shape over a relatively long range.

AB - Nanotips are the main components in most of the powerful nanotechnology tools like scanning tunneling microscope (STM) and scanning transmission electron microscope (TEM). Therefore the improvement of the performance of these microscopes relies on fabricating extremely sharp tips with well defined shapes. Tips with an apex radius of a few nanometers are often characterized in the field ion microscope (FIM) or the field emission microscope (FEM), to estimate their sizes. However, these methods are only sufficient for characterizing the very end of the tip. Here we present a quantitative model that links the electric field, which is adequate to generate either FIM or FEM images at certain applied voltages, to the radius of the nanotip and to the radius of the tip base as well. This model introduces a more accurate method to estimate the overall tip shape over a relatively long range.

KW - field emission

KW - nano electron source

KW - nano fabrication

KW - Nanotip

UR - https://www.scopus.com/pages/publications/79957980825

U2 - 10.1109/IEEEGCC.2011.5752518

DO - 10.1109/IEEEGCC.2011.5752518

M3 - Conference contribution

AN - SCOPUS:79957980825

SN - 9781612841199

T3 - 2011 IEEE GCC Conference and Exhibition, GCC 2011

SP - 25

EP - 28

BT - 2011 IEEE GCC Conference and Exhibition, GCC

T2 - 2011 IEEE GCC Conference and Exhibition, GCC 2011

Y2 - 19 February 2011 through 22 February 2011

ER -

Quantitative analysis to the electric field generated at a nano-tip and the effect of the tip base

Abstract

Publication series

Conference

UN SDGs

Keywords

Access to Document

OpenUrl availability

Other files and links

Fingerprint

Cite this