TY - GEN
T1 - Quantitative analysis to the electric field generated at a nano-tip and the effect of the tip base
AU - Rezeq, Moh'D
PY - 2011
Y1 - 2011
N2 - Nanotips are the main components in most of the powerful nanotechnology tools like scanning tunneling microscope (STM) and scanning transmission electron microscope (TEM). Therefore the improvement of the performance of these microscopes relies on fabricating extremely sharp tips with well defined shapes. Tips with an apex radius of a few nanometers are often characterized in the field ion microscope (FIM) or the field emission microscope (FEM), to estimate their sizes. However, these methods are only sufficient for characterizing the very end of the tip. Here we present a quantitative model that links the electric field, which is adequate to generate either FIM or FEM images at certain applied voltages, to the radius of the nanotip and to the radius of the tip base as well. This model introduces a more accurate method to estimate the overall tip shape over a relatively long range.
AB - Nanotips are the main components in most of the powerful nanotechnology tools like scanning tunneling microscope (STM) and scanning transmission electron microscope (TEM). Therefore the improvement of the performance of these microscopes relies on fabricating extremely sharp tips with well defined shapes. Tips with an apex radius of a few nanometers are often characterized in the field ion microscope (FIM) or the field emission microscope (FEM), to estimate their sizes. However, these methods are only sufficient for characterizing the very end of the tip. Here we present a quantitative model that links the electric field, which is adequate to generate either FIM or FEM images at certain applied voltages, to the radius of the nanotip and to the radius of the tip base as well. This model introduces a more accurate method to estimate the overall tip shape over a relatively long range.
KW - field emission
KW - nano electron source
KW - nano fabrication
KW - Nanotip
UR - http://www.scopus.com/inward/record.url?scp=79957980825&partnerID=8YFLogxK
U2 - 10.1109/IEEEGCC.2011.5752518
DO - 10.1109/IEEEGCC.2011.5752518
M3 - Conference contribution
AN - SCOPUS:79957980825
SN - 9781612841199
T3 - 2011 IEEE GCC Conference and Exhibition, GCC 2011
SP - 25
EP - 28
BT - 2011 IEEE GCC Conference and Exhibition, GCC
T2 - 2011 IEEE GCC Conference and Exhibition, GCC 2011
Y2 - 19 February 2011 through 22 February 2011
ER -