Quantification of dissipation and deformation in ambient atomic force microscopy

Sergio Santos, Karim R. Gadelrab, Victor Barcons, Marco Stefancich, Matteo Chiesa

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample deformation with picometer resolution.

Original languageBritish English
Article number073044
JournalNew Journal of Physics
Volume14
DOIs
StatePublished - Jul 2012

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