Protection Scheme for Modular Multilevel Converters under Diode Open-Circuit Faults

Fujin Deng; Rongwu Zhu; Dong Liu; Yanbo Wang; Huai Wang; Zhe Chen; Ming Cheng

doi:10.1109/TPEL.2017.2702748

Protection Scheme for Modular Multilevel Converters under Diode Open-Circuit Faults

Fujin Deng, Rongwu Zhu, Dong Liu, Yanbo Wang, Huai Wang, Zhe Chen, Ming Cheng

Research output: Contribution to journal › Article › peer-review

38 Scopus citations

Abstract

The modular multilevel converter (MMC) is attractive for medium-or high-power applications because of the advantages of its high modularity, availability, and high power quality. Reliability is one of the most important challenges for the MMC consisting of a large number of power electronic devices. The diode open-circuit fault in the submodule (SM) is an important issue for the MMC, which would affect the performance of the MMC and disrupt the operation of the MMC. This paper analyzes the impact of diode open-circuit failures in the SMs on the performance of the MMC and proposes a protection scheme for the MMC under diode open-circuit faults. The proposed protection scheme not only can effectively eliminate the possible caused high voltage due to the diode open-circuit fault but also can quickly detect the faulty SMs, which effectively avoids the destruction and protects the MMC. The proposed protection scheme is verified with a downscale MMC prototype in the laboratory. The results confirm the effectiveness of the proposed protection scheme for the MMC under diode open-circuit faults.

Original language	British English
Article number	7922575
Pages (from-to)	2866-2877
Number of pages	12
Journal	IEEE Transactions on Power Electronics
Volume	33
Issue number	4
DOIs	https://doi.org/10.1109/TPEL.2017.2702748
State	Published - Apr 2018

Keywords

Diode faults
modular multilevel converters (MMCs)
open-circuit fault
protection

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10.1109/TPEL.2017.2702748

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title = "Protection Scheme for Modular Multilevel Converters under Diode Open-Circuit Faults",

abstract = "The modular multilevel converter (MMC) is attractive for medium-or high-power applications because of the advantages of its high modularity, availability, and high power quality. Reliability is one of the most important challenges for the MMC consisting of a large number of power electronic devices. The diode open-circuit fault in the submodule (SM) is an important issue for the MMC, which would affect the performance of the MMC and disrupt the operation of the MMC. This paper analyzes the impact of diode open-circuit failures in the SMs on the performance of the MMC and proposes a protection scheme for the MMC under diode open-circuit faults. The proposed protection scheme not only can effectively eliminate the possible caused high voltage due to the diode open-circuit fault but also can quickly detect the faulty SMs, which effectively avoids the destruction and protects the MMC. The proposed protection scheme is verified with a downscale MMC prototype in the laboratory. The results confirm the effectiveness of the proposed protection scheme for the MMC under diode open-circuit faults.",

keywords = "Diode faults, modular multilevel converters (MMCs), open-circuit fault, protection",

author = "Fujin Deng and Rongwu Zhu and Dong Liu and Yanbo Wang and Huai Wang and Zhe Chen and Ming Cheng",

note = "Funding Information: Manuscript received March 21, 2017; accepted April 26, 2017. Date of publication May 9, 2017; date of current version January 3, 2018. This work was supported in part by the NSFC under Project 51320105002. Recommended for publication by Associate Editor J. Liu. (Correspondence Author: Fujin Deng.) F. Deng and M. Cheng are with the School of Electrical Engineering, Southeast University, Nanjing 210096, China (e-mail: [email protected]; [email protected]). Publisher Copyright: {\textcopyright} 1986-2012 IEEE.",

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AU - Deng, Fujin

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AU - Chen, Zhe

AU - Cheng, Ming

N1 - Funding Information: Manuscript received March 21, 2017; accepted April 26, 2017. Date of publication May 9, 2017; date of current version January 3, 2018. This work was supported in part by the NSFC under Project 51320105002. Recommended for publication by Associate Editor J. Liu. (Correspondence Author: Fujin Deng.) F. Deng and M. Cheng are with the School of Electrical Engineering, Southeast University, Nanjing 210096, China (e-mail: [email protected]; [email protected]). Publisher Copyright: © 1986-2012 IEEE.

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AB - The modular multilevel converter (MMC) is attractive for medium-or high-power applications because of the advantages of its high modularity, availability, and high power quality. Reliability is one of the most important challenges for the MMC consisting of a large number of power electronic devices. The diode open-circuit fault in the submodule (SM) is an important issue for the MMC, which would affect the performance of the MMC and disrupt the operation of the MMC. This paper analyzes the impact of diode open-circuit failures in the SMs on the performance of the MMC and proposes a protection scheme for the MMC under diode open-circuit faults. The proposed protection scheme not only can effectively eliminate the possible caused high voltage due to the diode open-circuit fault but also can quickly detect the faulty SMs, which effectively avoids the destruction and protects the MMC. The proposed protection scheme is verified with a downscale MMC prototype in the laboratory. The results confirm the effectiveness of the proposed protection scheme for the MMC under diode open-circuit faults.

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Protection Scheme for Modular Multilevel Converters under Diode Open-Circuit Faults

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