Prediction of crack density and electrical resistance changes in indium tin oxide/polymer thin films under tensile loading

Angel Mora, Kamran A. Khan, Tamer El Sayed

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We present unified predictions for the crack onset strain, evolution of crack density, and changes in electrical resistance in indium tin oxide/polymer thin films under tensile loading. We propose a damage mechanics model to quantify and predict such changes as an alternative to fracture mechanics formulations. Our predictions are obtained by assuming that there are no flaws at the onset of loading as opposed to the assumptions of fracture mechanics approaches. We calibrate the crack onset strain and the damage model based on experimental data reported in the literature. We predict crack density and changes in electrical resistance as a function of the damage induced in the films. We implement our model in the commercial finite element software ABAQUS using a user subroutine UMAT. We obtain fair to good agreement with experiments.

Original languageBritish English
Pages (from-to)546-561
Number of pages16
JournalInternational Journal of Damage Mechanics
Volume24
Issue number4
DOIs
StatePublished - 11 May 2015

Keywords

  • crack density
  • Damage mechanics
  • indium tin oxide
  • thin films

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