TY - JOUR
T1 - Power Electronics Reliability
T2 - State of the Art and Outlook
AU - Wang, Huai
AU - Blaabjerg, Frede
N1 - Funding Information:
This work was supported in part by VILLUM FONDEN under the VILLUM Investigators Grant REPEPS (Award 00016591) and in part by Innovation Fund Denmark through the Advanced Power Electronic Technology and Tools Project (APETT).
Publisher Copyright:
© 2013 IEEE.
PY - 2021/12/1
Y1 - 2021/12/1
N2 - This article aims to provide an update of the reliability aspects of research on power electronic components and hardware systems. It introduces the latest advances in the understanding of failure mechanisms, testing methods, accumulated damage modeling, and mission-profile-based reliability prediction. Component-level examples (e.g., Si IGBT modules, SiC MOSFETs, GaN devices, capacitors, and magnetic components) are used for illustration purposes in addition to system-level studies. The limitations and associated open questions are discussed to identify future research opportunities in power electronics reliability.
AB - This article aims to provide an update of the reliability aspects of research on power electronic components and hardware systems. It introduces the latest advances in the understanding of failure mechanisms, testing methods, accumulated damage modeling, and mission-profile-based reliability prediction. Component-level examples (e.g., Si IGBT modules, SiC MOSFETs, GaN devices, capacitors, and magnetic components) are used for illustration purposes in addition to system-level studies. The limitations and associated open questions are discussed to identify future research opportunities in power electronics reliability.
KW - Accelerated degradation testing
KW - condition monitoring
KW - control
KW - failure mechanism
KW - physics-of-degradation
KW - power electronics
KW - reliability prediction
UR - http://www.scopus.com/inward/record.url?scp=85098788014&partnerID=8YFLogxK
U2 - 10.1109/JESTPE.2020.3037161
DO - 10.1109/JESTPE.2020.3037161
M3 - Article
AN - SCOPUS:85098788014
SN - 2168-6777
VL - 9
SP - 6476
EP - 6493
JO - IEEE Journal of Emerging and Selected Topics in Power Electronics
JF - IEEE Journal of Emerging and Selected Topics in Power Electronics
IS - 6
ER -