@inbook{8a714600f49d413b9fb4eefcb31f4bf0,
title = "Power and Yield for SRAM Memory",
abstract = "As noted in the previous chapter, supply voltage, cell ratio, and threshold voltage of the devices are the factors that determine whether a cell is robust and stable. In addition to these factors, controlling variability through process technology further reduces the device parameter shift.",
keywords = "Memory Supplies, Process Technology Node, SRAM Cell, Voltage Islands, Wordline",
author = "Baker Mohammad",
note = "Publisher Copyright: {\textcopyright} 2014, Springer Science+Business Media New York.",
year = "2014",
doi = "10.1007/978-1-4614-8881-1_5",
language = "British English",
series = "Analog Circuits and Signal Processing",
publisher = "Springer",
pages = "53--59",
booktitle = "Analog Circuits and Signal Processing",
address = "Germany",
}