Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS

Alabi Bojesomo; Ibrahim Abe M. Elfadel; Ozgur Sinanoglu

doi:10.1109/DTIP.2019.8752778

Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS

Alabi Bojesomo
, Ibrahim Abe M. Elfadel
, Ozgur Sinanoglu

Computer & Communication Engineering

New York University Abu Dhabi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

The cyber and hardware security of constrained edge nodes have become a paramount requirement for the ultimate success of the Internet of Things (IoT). Such security needs to be guaranteed at minimum impact on energy efficiency and autonomy. One important approach to IoT energy autonmoy is the use of energy harvesters. In this paper, we select MEMS piezolelectric energy harvesters to propose a physically unclonable function (Piezo-PUF) which relies on the manufacturing uncertainties of the MEMS fabrication process. The major result of this paper is that several of the MEMS manufacturing uncertainties cannot be easily cloned, which leads to various mechanical and electrical features that can be leveraged for generating cryptographic keys. Thorough security analysis of Piezo-PUF has been conducted using wafer-level simulations and measurements. The security analysis confirms that Piezo-PUF qualifies as weak PUF for secure key generation and authentication.

Original language	British English
Title of host publication	2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728132860
DOIs	https://doi.org/10.1109/DTIP.2019.8752778
State	Published - May 2019
Event	2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019 - Paris, France Duration: 12 May 2019 → 15 May 2019

Publication series

Name	2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019

Conference

Conference	2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019
Country/Territory	France
City	Paris
Period	12/05/19 → 15/05/19

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy
SDG 9 Industry, Innovation, and Infrastructure

Access to Document

10.1109/DTIP.2019.8752778

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Cite this

Bojesomo, A., Elfadel, I. A. M., & Sinanoglu, O. (2019). Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. In 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019 Article 8752778 (2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DTIP.2019.8752778

Bojesomo, Alabi ; Elfadel, Ibrahim Abe M. ; Sinanoglu, Ozgur. / Piezo-PUF : Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019. Institute of Electrical and Electronics Engineers Inc., 2019. (2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019).

@inproceedings{94fb1f22231a4cfba4f3525e3da3fe50,

title = "Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS",

abstract = "The cyber and hardware security of constrained edge nodes have become a paramount requirement for the ultimate success of the Internet of Things (IoT). Such security needs to be guaranteed at minimum impact on energy efficiency and autonomy. One important approach to IoT energy autonmoy is the use of energy harvesters. In this paper, we select MEMS piezolelectric energy harvesters to propose a physically unclonable function (Piezo-PUF) which relies on the manufacturing uncertainties of the MEMS fabrication process. The major result of this paper is that several of the MEMS manufacturing uncertainties cannot be easily cloned, which leads to various mechanical and electrical features that can be leveraged for generating cryptographic keys. Thorough security analysis of Piezo-PUF has been conducted using wafer-level simulations and measurements. The security analysis confirms that Piezo-PUF qualifies as weak PUF for secure key generation and authentication.",

author = "Alabi Bojesomo and Elfadel, \{Ibrahim Abe M.\} and Ozgur Sinanoglu",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019 ; Conference date: 12-05-2019 Through 15-05-2019",

year = "2019",

month = may,

doi = "10.1109/DTIP.2019.8752778",

language = "British English",

series = "2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019",

address = "United States",

}

Bojesomo, A, Elfadel, IAM & Sinanoglu, O 2019, Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. in 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019., 8752778, 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019, Institute of Electrical and Electronics Engineers Inc., 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019, Paris, France, 12/05/19. https://doi.org/10.1109/DTIP.2019.8752778

Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. / Bojesomo, Alabi; Elfadel, Ibrahim Abe M.; Sinanoglu, Ozgur.
2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 8752778 (2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Piezo-PUF

T2 - 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019

AU - Bojesomo, Alabi

AU - Elfadel, Ibrahim Abe M.

AU - Sinanoglu, Ozgur

PY - 2019/5

Y1 - 2019/5

N2 - The cyber and hardware security of constrained edge nodes have become a paramount requirement for the ultimate success of the Internet of Things (IoT). Such security needs to be guaranteed at minimum impact on energy efficiency and autonomy. One important approach to IoT energy autonmoy is the use of energy harvesters. In this paper, we select MEMS piezolelectric energy harvesters to propose a physically unclonable function (Piezo-PUF) which relies on the manufacturing uncertainties of the MEMS fabrication process. The major result of this paper is that several of the MEMS manufacturing uncertainties cannot be easily cloned, which leads to various mechanical and electrical features that can be leveraged for generating cryptographic keys. Thorough security analysis of Piezo-PUF has been conducted using wafer-level simulations and measurements. The security analysis confirms that Piezo-PUF qualifies as weak PUF for secure key generation and authentication.

AB - The cyber and hardware security of constrained edge nodes have become a paramount requirement for the ultimate success of the Internet of Things (IoT). Such security needs to be guaranteed at minimum impact on energy efficiency and autonomy. One important approach to IoT energy autonmoy is the use of energy harvesters. In this paper, we select MEMS piezolelectric energy harvesters to propose a physically unclonable function (Piezo-PUF) which relies on the manufacturing uncertainties of the MEMS fabrication process. The major result of this paper is that several of the MEMS manufacturing uncertainties cannot be easily cloned, which leads to various mechanical and electrical features that can be leveraged for generating cryptographic keys. Thorough security analysis of Piezo-PUF has been conducted using wafer-level simulations and measurements. The security analysis confirms that Piezo-PUF qualifies as weak PUF for secure key generation and authentication.

UR - https://www.scopus.com/pages/publications/85069483084

U2 - 10.1109/DTIP.2019.8752778

DO - 10.1109/DTIP.2019.8752778

M3 - Conference contribution

AN - SCOPUS:85069483084

T3 - 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019

BT - 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 12 May 2019 through 15 May 2019

ER -

Bojesomo A, Elfadel IAM, Sinanoglu O. Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. In 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019. Institute of Electrical and Electronics Engineers Inc. 2019. 8752778. (2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019). doi: 10.1109/DTIP.2019.8752778

Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS

Abstract

Publication series

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UN SDGs

Access to Document

OpenUrl availability

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