@inproceedings{fe508c83e5fe43a8bfaf3d91bb00adc3,
title = "Photoelectric Characterization of a Single Layer of CNTs using CAFM",
abstract = "Detailed investigations for the photoelectric characteristics of a single-layer of carbon nanotubes (CNTs) have been performed using a conductive mode atomic force microscope (CAFM). The diluted CNTs were drop-casted on a SiO2/n-Si substrate followed by annealing in N2 ambient for 2 hours at 70°C. Individual CNTs were identified using the AC imaging mode of atomic force microscope (AFM). Subsequently, the electrical measurements were performed using CAFM with an Au-coated tip placed directly on the CNTs. A lower turn-on voltage is observed for the shorter wavelength of light illuminated on the CNTs, compared to that of a long light wavelength, indicating higher energy electrons are excited to the conduction band of the CNT.",
author = "Y. Abbas and M. Baker and M. Rezeq",
note = "Funding Information: *Research supported by and System on Chip Lab, Khalifa University of Science and Technology. Publisher Copyright: {\textcopyright} 2022 IEEE.; 22nd IEEE International Conference on Nanotechnology, NANO 2022 ; Conference date: 04-07-2022 Through 08-07-2022",
year = "2022",
doi = "10.1109/NANO54668.2022.9928657",
language = "British English",
series = "Proceedings of the IEEE Conference on Nanotechnology",
publisher = "IEEE Computer Society",
pages = "186--189",
booktitle = "2022 IEEE 22nd International Conference on Nanotechnology, NANO 2022",
address = "United States",
}