Photoelectric Characterization of a Single Layer of CNTs using CAFM

Y. Abbas, M. Baker, M. Rezeq

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Detailed investigations for the photoelectric characteristics of a single-layer of carbon nanotubes (CNTs) have been performed using a conductive mode atomic force microscope (CAFM). The diluted CNTs were drop-casted on a SiO2/n-Si substrate followed by annealing in N2 ambient for 2 hours at 70°C. Individual CNTs were identified using the AC imaging mode of atomic force microscope (AFM). Subsequently, the electrical measurements were performed using CAFM with an Au-coated tip placed directly on the CNTs. A lower turn-on voltage is observed for the shorter wavelength of light illuminated on the CNTs, compared to that of a long light wavelength, indicating higher energy electrons are excited to the conduction band of the CNT.

Original languageBritish English
Title of host publication2022 IEEE 22nd International Conference on Nanotechnology, NANO 2022
PublisherIEEE Computer Society
Pages186-189
Number of pages4
ISBN (Electronic)9781665452250
DOIs
StatePublished - 2022
Event22nd IEEE International Conference on Nanotechnology, NANO 2022 - Palma de Mallorca, Spain
Duration: 4 Jul 20228 Jul 2022

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
Volume2022-July
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Conference

Conference22nd IEEE International Conference on Nanotechnology, NANO 2022
Country/TerritorySpain
CityPalma de Mallorca
Period4/07/228/07/22

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