Periodicity in bimodal atomic force microscopy

Chia Yun Lai, Victor Barcons, Sergio Santos, Matteo Chiesa

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship between the excited frequencies is shown to affect and control both experimental observables and the main expressions quantified via these observables, i.e., virial and energy transfer expressions, which form the basis of the bimodal AFM theory. The presence of a fundamental frequency further simplifies the theory and leads to close form solutions. Predictions are verified via numerical integration of the equation of motion and experimentally on a mica surface.

Original languageBritish English
Article number044905
JournalJournal of Applied Physics
Volume118
Issue number4
DOIs
StatePublished - 28 Jul 2015

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