Numerical versus analytical Ic(H) patterns in Josephson junctions with periodically alternating critical current density

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    Abstract

    An analytical expression for the magnetic-field-dependent critical current Ic(#) of Josephson junctions with periodically alternating critical current density Jc(x) is derived within the uniform field approximation. Comparison with numerically calculated Ic(H) patterns for junctions with identical, thick, periodically arranged defects with the corresponding analytical expression reveals fair agreement for a wide range of parameters, due to increased characteristic length. Based on qualitative arguments, we give the dependence of the new characteristic length on the geometrical parameters of the junction, which is in agreement with self-consistent calculations with the static sine-Gordon equation. The analytical expression captures the observed qualitative features of the I c(H) patterns, while it is practically exact for short junctions or high fields. It also produces the shift of the major peak from the zero-field position of the standard Fraunhofer pattern to another position related to the periodicity of the critical current density in φ-junctions.

    Original languageBritish English
    Pages (from-to)585-591
    Number of pages7
    JournalSuperconductor Science and Technology
    Volume17
    Issue number4
    DOIs
    StatePublished - Apr 2004

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