@inproceedings{039393a5414441f18ee8596534fb1fc2,
title = "Novel hafnium oxide memristor device: Switching behaviour and size effect",
abstract = "Unipolar RRAM devices are of high interest due to their high resistance ratio and simple selector circuit. In this paper, we report on a measurements from nano-thick memristor featuring a novel Pd/Hf/HfO2/Pd stack. The fabricated device exhibits a unipolar switching behavior, due to the asymmetric device structure and the existence of the Pd metal as a bottom electrode. The forming voltage of the proposed memristive stack (Hf-10nm/HfO2-10nm) is found to be size dependent at the microscale and its average forming voltage decreases by 20% when the active area increases from 30×30 to 1000×1000 μm2. The findings presented in this work highlight the impact of device geometry on its electrical performance and power, which provide guidance to the design tradeoffs (size, power, resistance ratio) and fabrication process of memristor devices.",
keywords = "capping, device size, HfO2, nano-thick memristor, unipolar",
author = "Heba Abunahla and Baker Mohammad and Jaoude, {Maguy Abi} and Mahmoud Al-Qutayri",
note = "Funding Information: Financial support was obtained through KUSTAR–KUIRF2 internal research fund (grant no: 2014-210066). The authors would like to acknowledge the access granted to KSRC-lab and KUSTAR-Core Facilities for running the electrical and physical characterization studies. The authors are grateful to UNAM research group led by Dr. Ali Okyay at Bilkent University, Turkey, for the device fabrication. Thanks to Vikas Kumar for his support with the wafer design. Special thanks to Dr. Curtis OKelly, Yasmin Halawani and Umalkhair Ahmed for their help with the characterization studies of the devices. Publisher Copyright: {\textcopyright} 2017 IEEE.; 50th IEEE International Symposium on Circuits and Systems, ISCAS 2017 ; Conference date: 28-05-2017 Through 31-05-2017",
year = "2017",
month = sep,
day = "25",
doi = "10.1109/ISCAS.2017.8050791",
language = "British English",
series = "Proceedings - IEEE International Symposium on Circuits and Systems",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "IEEE International Symposium on Circuits and Systems",
address = "United States",
}