Non-linear characterization of memoryless SSP amplifiers

This paper describes a testbed, which is able to generate all of the standard test signals used for characterising non-linear amplifiers. The testbed is shown to be sufficiently linear to avoid any possible masking of the non-linear effects of the amplifier under test. All the standard tests: Single-carrier, two-carrier, multi-carrier and NPR are applied to a laboratory amplifier and their results found to be in reasonably good agreement with the most popular prediction techniques. The merits of the individual test have been highlighted.