TY - GEN
T1 - New Approaches to Reliability Assessment
T2 - Using physics-of-failure for prediction and design in power electronics systems
AU - Ma, Ke
AU - Wang, Huai
AU - Blaabjerg, Frede
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2016/12
Y1 - 2016/12
N2 - Power electronics are facing continuous pressure to be cheaper and smaller, have a higher power density, and, in some cases, also operate at higher temperatures. At the same time, power electronics products are expected to have reduced failures because it is essential for reducing the cost of energy. New approaches for reliability assessment are being taken in the design phase of power electronics systems based on the physics-of-failure in components. In this approach, many new methods, such as multidisciplinary simulation tools, strength testing of components, translation of mission profiles, and statistical analysis, are involved to enable better prediction and design of reliability for products. This article gives an overview of the new design flow in the reliability engineering of power electronics from the system-level point of view and discusses some of the emerging needs for the technology in this field.
AB - Power electronics are facing continuous pressure to be cheaper and smaller, have a higher power density, and, in some cases, also operate at higher temperatures. At the same time, power electronics products are expected to have reduced failures because it is essential for reducing the cost of energy. New approaches for reliability assessment are being taken in the design phase of power electronics systems based on the physics-of-failure in components. In this approach, many new methods, such as multidisciplinary simulation tools, strength testing of components, translation of mission profiles, and statistical analysis, are involved to enable better prediction and design of reliability for products. This article gives an overview of the new design flow in the reliability engineering of power electronics from the system-level point of view and discusses some of the emerging needs for the technology in this field.
UR - http://www.scopus.com/inward/record.url?scp=85013102352&partnerID=8YFLogxK
U2 - 10.1109/MPEL.2016.2615277
DO - 10.1109/MPEL.2016.2615277
M3 - Article
AN - SCOPUS:85013102352
SN - 2329-9207
VL - 3
SP - 28
EP - 41
JO - IEEE Power Electronics Magazine
JF - IEEE Power Electronics Magazine
ER -