Nanotips characterization, modeling and simulation

Ahmed Ali; Hassan Barada; Moh'D Rezeq

doi:10.1109/ICECS.2013.6815466

Nanotips characterization, modeling and simulation

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Nanotips continue to be of crucial importance to Electron Microscopes, the sharpness of such nanotips plays a vital role in producing coherent electron and ion beams and hence improving the scanning resolution of these microscopes. Thus, a lot of research is being conducted to fabricate the ultimate sharp tip using Field Emission Microscope (FEM) and Field Ion Microscope (FIM). However, FEM and FIM micrographs show only a top view of the nanotip but do not reveal enough information about the overall tip geometry. In this paper, we present modeling and simulation methods that can help in obtaining more in-depth information about the overall tip shape.

Original language	British English
Title of host publication	2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	523-525
Number of pages	3
ISBN (Print)	9781479924523
DOIs	https://doi.org/10.1109/ICECS.2013.6815466
State	Published - 2013
Event	2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013 - Abu Dhabi, United Arab Emirates Duration: 8 Dec 2013 → 11 Dec 2013

Publication series

Name	Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Conference

Conference	2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013
Country/Territory	United Arab Emirates
City	Abu Dhabi
Period	8/12/13 → 11/12/13

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10.1109/ICECS.2013.6815466

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Ali, A., Barada, H., & Rezeq, MD. (2013). Nanotips characterization, modeling and simulation. In 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013 (pp. 523-525). Article 6815466 (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICECS.2013.6815466

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title = "Nanotips characterization, modeling and simulation",

abstract = "Nanotips continue to be of crucial importance to Electron Microscopes, the sharpness of such nanotips plays a vital role in producing coherent electron and ion beams and hence improving the scanning resolution of these microscopes. Thus, a lot of research is being conducted to fabricate the ultimate sharp tip using Field Emission Microscope (FEM) and Field Ion Microscope (FIM). However, FEM and FIM micrographs show only a top view of the nanotip but do not reveal enough information about the overall tip geometry. In this paper, we present modeling and simulation methods that can help in obtaining more in-depth information about the overall tip shape.",

author = "Ahmed Ali and Hassan Barada and Moh'D Rezeq",

year = "2013",

doi = "10.1109/ICECS.2013.6815466",

language = "British English",

isbn = "9781479924523",

series = "Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "523--525",

booktitle = "2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013",

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note = "2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013 ; Conference date: 08-12-2013 Through 11-12-2013",

}

Ali, A, Barada, H & Rezeq, MD 2013, Nanotips characterization, modeling and simulation. in 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013., 6815466, Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, Institute of Electrical and Electronics Engineers Inc., pp. 523-525, 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, United Arab Emirates, 8/12/13. https://doi.org/10.1109/ICECS.2013.6815466

Nanotips characterization, modeling and simulation. / Ali, Ahmed; Barada, Hassan ; Rezeq, Moh'D.
2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013. Institute of Electrical and Electronics Engineers Inc., 2013. p. 523-525 6815466 (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - Nanotips continue to be of crucial importance to Electron Microscopes, the sharpness of such nanotips plays a vital role in producing coherent electron and ion beams and hence improving the scanning resolution of these microscopes. Thus, a lot of research is being conducted to fabricate the ultimate sharp tip using Field Emission Microscope (FEM) and Field Ion Microscope (FIM). However, FEM and FIM micrographs show only a top view of the nanotip but do not reveal enough information about the overall tip geometry. In this paper, we present modeling and simulation methods that can help in obtaining more in-depth information about the overall tip shape.

AB - Nanotips continue to be of crucial importance to Electron Microscopes, the sharpness of such nanotips plays a vital role in producing coherent electron and ion beams and hence improving the scanning resolution of these microscopes. Thus, a lot of research is being conducted to fabricate the ultimate sharp tip using Field Emission Microscope (FEM) and Field Ion Microscope (FIM). However, FEM and FIM micrographs show only a top view of the nanotip but do not reveal enough information about the overall tip geometry. In this paper, we present modeling and simulation methods that can help in obtaining more in-depth information about the overall tip shape.

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DO - 10.1109/ICECS.2013.6815466

M3 - Conference contribution

AN - SCOPUS:84901470483

SN - 9781479924523

T3 - Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

SP - 523

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BT - 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013

Y2 - 8 December 2013 through 11 December 2013

ER -

Ali A, Barada H , Rezeq MD. Nanotips characterization, modeling and simulation. In 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems, ICECS 2013. Institute of Electrical and Electronics Engineers Inc. 2013. p. 523-525. 6815466. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems). doi: 10.1109/ICECS.2013.6815466

Nanotips characterization, modeling and simulation

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