Nanotip apex modification with atomic precision and single atom tips restoration

Moh'd Rezeq, Christian Joachim, N. Chandrasekhar

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Nanotip technology is increasingly demanded for molecular and atomic characterizations and manipulations. Restoration of the atomic structure of the tip apex in situ is a crucial factor in this work. We demonstrate the modification of the apex structure with atomic precision down to a single atom and introduce a new approach for modelling the arrangement of atoms of the topmost layer. Nanotips with an apex of a single and multiple atoms have been repeatedly fabricated and field emission microscopy has been conducted for various atomic structures. Direct comparisons between field ion and field electron images have revealed that the field electron emission is exclusively confined to protruding apex atoms.

Original languageBritish English
Pages (from-to)996-998
Number of pages3
JournalMicroelectronic Engineering
Volume86
Issue number4-6
DOIs
StatePublished - Apr 2009

Keywords

  • Field electron emission
  • Field ion microscopy
  • Nanotips

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