MOS memory with double-layer high-κ tunnel oxide Al2O3/HfO2 and ZnO charge trapping layer
- Nazek El-Atab
- , Ammar Nayfeh
- , Berk Berkan Turgut
- , Ali K. Okyay
- Bilkent University
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
4
Scopus
citations