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Dive into the research topics of 'Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects'. Together they form a unique fingerprint.- Sort by
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Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects
- Heba Abunahla
- , Baker Mohammad
- , Dirar Homouz
- , Curtis J. Okelly
Research output: Contribution to journal › Article › peer-review
31
Scopus
citations