Modeling of nanotips fabricated by local electron bombardment

Moh'D Rezeq; Ahmed Ali; Hassan Barada

doi:10.1109/NANO.2015.7388706

Modeling of nanotips fabricated by local electron bombardment

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Nanotips have attracted increasing interest in several aspects of nanotechnology, particularly in nanotip based microscopy and nano-characterization. Therefore, fabricating nanotips with well-defined shapes and in a highly controllable way is vital. Here we present some characterization analysis of nanotips prepared by the recently developed local electron bombardment method. The nanotip shape is modeled by building the crystal structure of the nanotip apex to estimate its size. Then the overall nanotip shape is estimated by sequentially destructing the entire nanotip and utilizing finite element simulation tools to build a nanotip model. The simulation model is made in a way to generate the same threshold electric field, in the field ion microscope (FIM), before and after the nanotip destruction.

Original language	British English
Title of host publication	IEEE-NANO 2015 - 15th International Conference on Nanotechnology
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	714-716
Number of pages	3
ISBN (Electronic)	9781467381550
DOIs	https://doi.org/10.1109/NANO.2015.7388706
State	Published - 2015
Event	15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy Duration: 27 Jul 2015 → 30 Jul 2015

Publication series

Name	IEEE-NANO 2015 - 15th International Conference on Nanotechnology

Conference

Conference	15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
Country/Territory	Italy
City	Rome
Period	27/07/15 → 30/07/15

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

nano-characterization
nanofabrication
nanotip

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10.1109/NANO.2015.7388706

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title = "Modeling of nanotips fabricated by local electron bombardment",

abstract = "Nanotips have attracted increasing interest in several aspects of nanotechnology, particularly in nanotip based microscopy and nano-characterization. Therefore, fabricating nanotips with well-defined shapes and in a highly controllable way is vital. Here we present some characterization analysis of nanotips prepared by the recently developed local electron bombardment method. The nanotip shape is modeled by building the crystal structure of the nanotip apex to estimate its size. Then the overall nanotip shape is estimated by sequentially destructing the entire nanotip and utilizing finite element simulation tools to build a nanotip model. The simulation model is made in a way to generate the same threshold electric field, in the field ion microscope (FIM), before and after the nanotip destruction.",

keywords = "nano-characterization, nanofabrication, nanotip",

author = "Moh'D Rezeq and Ahmed Ali and Hassan Barada",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 ; Conference date: 27-07-2015 Through 30-07-2015",

year = "2015",

doi = "10.1109/NANO.2015.7388706",

language = "British English",

series = "IEEE-NANO 2015 - 15th International Conference on Nanotechnology",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "714--716",

booktitle = "IEEE-NANO 2015 - 15th International Conference on Nanotechnology",

address = "United States",

}

Rezeq, MD, Ali, A & Barada, H 2015, Modeling of nanotips fabricated by local electron bombardment. in IEEE-NANO 2015 - 15th International Conference on Nanotechnology., 7388706, IEEE-NANO 2015 - 15th International Conference on Nanotechnology, Institute of Electrical and Electronics Engineers Inc., pp. 714-716, 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015, Rome, Italy, 27/07/15. https://doi.org/10.1109/NANO.2015.7388706

Modeling of nanotips fabricated by local electron bombardment. / Rezeq, Moh'D; Ali, Ahmed; Barada, Hassan.
IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. p. 714-716 7388706 (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Modeling of nanotips fabricated by local electron bombardment

AU - Rezeq, Moh'D

AU - Ali, Ahmed

AU - Barada, Hassan

PY - 2015

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N2 - Nanotips have attracted increasing interest in several aspects of nanotechnology, particularly in nanotip based microscopy and nano-characterization. Therefore, fabricating nanotips with well-defined shapes and in a highly controllable way is vital. Here we present some characterization analysis of nanotips prepared by the recently developed local electron bombardment method. The nanotip shape is modeled by building the crystal structure of the nanotip apex to estimate its size. Then the overall nanotip shape is estimated by sequentially destructing the entire nanotip and utilizing finite element simulation tools to build a nanotip model. The simulation model is made in a way to generate the same threshold electric field, in the field ion microscope (FIM), before and after the nanotip destruction.

AB - Nanotips have attracted increasing interest in several aspects of nanotechnology, particularly in nanotip based microscopy and nano-characterization. Therefore, fabricating nanotips with well-defined shapes and in a highly controllable way is vital. Here we present some characterization analysis of nanotips prepared by the recently developed local electron bombardment method. The nanotip shape is modeled by building the crystal structure of the nanotip apex to estimate its size. Then the overall nanotip shape is estimated by sequentially destructing the entire nanotip and utilizing finite element simulation tools to build a nanotip model. The simulation model is made in a way to generate the same threshold electric field, in the field ion microscope (FIM), before and after the nanotip destruction.

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KW - nanofabrication

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M3 - Conference contribution

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BT - IEEE-NANO 2015 - 15th International Conference on Nanotechnology

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015

Y2 - 27 July 2015 through 30 July 2015

ER -

Modeling of nanotips fabricated by local electron bombardment

Abstract

Publication series

Conference

UN SDGs

Keywords

Access to Document

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