Mission-Profile-Based System-Level Reliability Analysis in DC Microgrids

Saeed Peyghami, Huai Wang, Pooya Davari, Frede Blaabjerg

    Research output: Contribution to journalArticlepeer-review

    50 Scopus citations

    Abstract

    Mission profiles such as environmental and operational conditions together with the system structure including energy resources, grid and converter topologies induce stress on different converters and thereby play a significant role on power electronic systems reliability. Temperature swing and maximum temperature are two of the critical stressors on the most failure-prone components of converters, i.e., capacitors and power semiconductors. Temperature-related stressors generate electrothermal stress on these components ultimately triggering high potential failure mechanisms. Failure of any component may cause converter outage and system shutdown. This paper explores the reliability performance of different converters operating in a power system and indicates the failure-prone converters from wear out perspective. It provides a system-level reliability insight for design, control, and operation of multiconverter system by extending the mission-profile-based reliability estimation approach. The analysis is provided for a dc microgrid due to the increasing interest that dc systems have been gaining in recent years; however, it can be applied for reliability studies in any multiconverter system. The outcomes can be worthwhile for maintenance and risk management as well as security assessment in modern power systems.

    Original languageBritish English
    Article number8727971
    Pages (from-to)5055-5067
    Number of pages13
    JournalIEEE Transactions on Industry Applications
    Volume55
    Issue number5
    DOIs
    StatePublished - 1 Sep 2019

    Keywords

    • Application-specific reliability
    • critical stressor
    • dc microgrid
    • energy management
    • lifetime
    • mission profile
    • reliability
    • system architecture

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