Millimeter wave imaging of surface defects and corrosion under paint using v-band reflectometer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Periodic inspection of critical metal structures that are used in numerous industries worldwide, is imperative to guarantee structural integrity. These structures are vulnerable to near surface defects and corrosion, which can cause severe repercussions if unattended. An effective, reliable and real time technique for evaluation of anomalies in these metallic structures is the need of the hour. In this paper, millimeter wave imaging of surface defects of practical importance such as holes and notches and corrosion under paint for metallic structures is presented. A reflectometer operating in V-band (50-75 GHz) is employed for imaging and the images produced by the millimeter wave system are benchmarked with the popular Phased Array Ultrasonic Testing (PAUT). It is demonstrated that millimeter wave imaging system is effective in detecting surface defects as well as corrosion under paint and renders high quality images, comparable to PAUT.

Original languageBritish English
Title of host publicationIST 2019 - IEEE International Conference on Imaging Systems and Techniques, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728138688
DOIs
StatePublished - Dec 2019
Event2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019 - Abu Dhabi, United Arab Emirates
Duration: 8 Dec 201910 Dec 2019

Publication series

NameIST 2019 - IEEE International Conference on Imaging Systems and Techniques, Proceedings

Conference

Conference2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019
Country/TerritoryUnited Arab Emirates
CityAbu Dhabi
Period8/12/1910/12/19

Keywords

  • corrosion under paint
  • millimeter wave imaging
  • non-destructive testing
  • open-ended waveguide
  • phased array ultrasonic testing
  • reflectometer
  • surface defects

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