Memristor Device Modeling

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

5 Scopus citations

Abstract

This chapter presents a physics-based mathematical model for anionic memristor devices. The model utilizes Poisson Boltzmann equation to account for temperature effect on device potential at equilibrium and comprehends material effect on device behaviors. A detailed MATLAB-based algorithm is developed to clarify and simplify the simulation environment. Moreover, the provided model is used to simulate and predict the effect of oxide thickness, material type, and operating temperatures on the electrical characteristics of the device. The value of this contribution is to provide a framework intended to simulate anionic memristor devices using correlated mathematical models. In addition, the model can be used to explore device materials and predict its performance.

Original languageBritish English
Title of host publicationAnalog Circuits and Signal Processing
PublisherSpringer
Pages93-104
Number of pages12
DOIs
StatePublished - 2018

Publication series

NameAnalog Circuits and Signal Processing
ISSN (Print)1872-082X
ISSN (Electronic)2197-1854

Keywords

  • Boltzmann
  • Memristor
  • Oxide
  • Parameter
  • Poisson
  • Potential
  • Profile
  • Switching
  • Temperature
  • Thickness
  • Vacancy
  • VCM
  • Voltage

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