Abstract
The authors would like to make an addition to the caption of Fig. 1, notifying partly reused material from another journal. We would like to add the following in the caption of Fig. 1: Partly reused from N. El-Atab et al., Appl. Phys. Lett. 104, 013112 (2014) [4].
| Original language | British English |
|---|---|
| Pages (from-to) | 2264 |
| Number of pages | 1 |
| Journal | Physica Status Solidi (A) Applications and Materials Science |
| Volume | 213 |
| Issue number | 8 |
| DOIs |
|
| State | Published - 1 Aug 2016 |
Keywords
- atomic layer deposition
- charge trapping memory
- laser processing
- metal–oxide–semiconductor structures
- nanoparticles
- silicon
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Dive into the research topics of 'Memory effect by charging of ultra-small 2-nm laser-synthesized solution processable Si-nanoparticles embedded in Si–Al2O3–SiO2structure [Phys. Status Solidi A 212, 1751–1755 (2015)] (Appl. Phys. Lett., (2014), 104, (13112), 10.1002/pssa.201431802)'. Together they form a unique fingerprint.Cite this
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